E8311A & E8312A

Agilent Technologies

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  • A 165 MHz (E8311A) and 330 MHz (E8312A) VXI C-1 pulse/pattern generator
  • Timing parameters can be adjusted for every amplitude or offset level to meet any specification
  • Fixed trigger-in to signal-out delay and variable delay ranges, enable highly reliable and stable synchronization of test systems even at very precise points in time, such as those used in radar testing
  • Equipped with VXI plug&play software drivers
  • Compatible with Agilent's box pulse generators (81100 and 8110A), already used in many laboratories handling R&D and quality test applications, making it easy to transition test routines from lab to production site
  • Serial patterning capabilities at up to 16 Kbits/channel permit simulation of complex protocols, using pre-configured standard formats such as RZ, NRZ, DNRZ, or PRBS
  • Pulse-width modulated signals, such as those used for testing regulating circuits, can be programmed and emulated
  • Variable transition times guarantee that rise and fall measurements are fully adjustable, thereby avoiding spikes, cross talk, and ringing when logic designs are tested at low speeds (10 MHz to 100 MHz)
  • Inverted outputs allow generating differential signals for testing high-speed (>100 MHz) buses based on LVDS (Low Voltage Differential Signaling) technology for other specialized computer and communications applications
  • 1-slot, C-size, register based
  • Two output channels, SMA (f) 3.5 mm: 165 MHz, 10 V, 50 Ohm into 50 Ohm, single-ended (E8311A) and 330 MHz, 3.8 V, 50 Ohm into 50 Ohm, differential (E8312A)
  • 16-Kbit patterns per channel
  • Fast transition times of 2 nsec to 200 ms variable (Agilent E8311A) and 0.8 nsec or 1.6 nsec selectable (Agilent E8312A)
  • Functionally compatible with the Agilent 81110A
  • Broad range of trigger and synchronization capabilities

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