NI releases test system with ATE Core Configurations at NIWeek 2017

AUSTIN. AT NIWeek 2017, National Instruments (NI) officials announced a new ATE Core Configurations, which delivers mechanical, power, and safety infrastructure to help users accelerate the design and build of automated test systems in industries that range from semiconductor, consumer electronics, aerospace, and automotive.

NI's ATE Core Configurations are available in various rack-unit heights, and offer scalable power profiles. Test organizations can benefit from safety features such as shutoff, emergency power off (EPO), optional uninterruptible power supplies, and IEC 61010 certification.

"Building a test system is a difficult job – one that even the best organizations spend many months accomplishing purely because of the number of components, suppliers and interoperability challenges present,” says Luke Schreier, director of automated test product marketing at NI. “The new ATE Core Configurations can help users dramatically simplify the purchasing process for a common set of requirements and reduce the time and cost of building a system. And when you ultimately want a turn-key system, they form a great bridge to the integration expertise of our Alliance Partner Network.”

ATE Core Configurations also utilizes NI’s instrumentation and test portfolio. This includes PXI instruments ranging from DC to mmWave featuring high-throughput data movement using PCI Express Gen 3 bus interfaces and sub-nanosecond synchronization with integrated timing and triggering. ATE Core Configurations can also include TestStand test management software and LabVIEW code module development software, extensive API and example program support for PXI instruments, and more than 13,000 instrument drivers for third-party box instruments.

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